Total Funding
30
76
Total FundingGrant raised
Growth Score
0 pts
Heat Score
-3 pts
Company Performance Metrics
Score
Trend
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Growth Score - The measure of growth based on company activity, operational metrics, and investments
Growth Trend - The change in the growth score over the given time period
Heat Score - The measure of the market interest, media activity, and Crunchbase profile activity
Heat Trend - The change in the heat score over the given time period
Recent Milestones
Raised Funding Round
Jan 1, 1970
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Raised Funding Round
Jan 1, 1970
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142493
Active Layer Parametrics develops advanced semiconductor metrology tools for high-resolution electrical analysis.
- Michael Gough: CFO
- Abhijeet Joshi: Co-Founder, CTO and Board MemberPast Role: UCLA Extension, Graduate Research Assistant
About the Company
Active Layer Parametrics (ALP Inc.) has developed a system to rapidly and accurately measure mobility and activated carrier concentration profiles with Angstrom-level resolution for the semiconductor manufacturing industry. These profiles detail the depth of electrical activation due to implant-anneal recipes. We're the only system in the
world that is capable of doing these measurements on a routine basis. The goal of the company is: Improve Yield by Quick Feedback: Instead having to wait for weeks to get devices made, we could do that in a matter of minutes. Improve Device performance: By tracking process changes to electronic impact - we currently do this 'matrix-analysis'.
