An LED-based Quantum Efficiency system that measures broadband reflectance, external QE, reflectance, and Jsc simultaneously over a wide wavelength range, available in various configurations including desktop, XY mapper, module scanner, and inline inspection systems.

A time-resolved thermography system that identifies solar cells with shunt defects (hot spots) in less than 300 milliseconds, designed for integration into cell manufacturing lines or as a standalone R&D machine.